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First published 2002-7

Measurement of Wavelength-Dependent Complex Refractive Index of Transparent and Absorbing Liquids by a Multifunction Reflectometer

Jukka Räty, Kai-Erik Peiponen, Anssi Jääskeläinen [...]

Applied Spectroscopy

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Other

First published 2002-8

Determination of the Complex Refractive Index of Materials via Infrared Measurements

Christos-Platon E. Varsamis

Applied Spectroscopy

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Research article

First published 2018-9

Complex Refractive Index Dispersion of Strong Absorbing Material Determined Using Internal Reflectance Spectra Measurement

Zhichao Deng, Jin Wang, Zhixiong Hu [...]

Applied Spectroscopy

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Research article

First published 2025

Extension of Complex Refractive Index Measurements to the Near-Infrared for Liquids: Methodology and Uncertainty Analysis

Oliva M. Primera-Pedrozo, Russell G. Tonkyn, Tracy J. Baker [...]

Applied Spectroscopy

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Research article

First published 2004-5

Infrared Complex Refractive Index Measurements and Simulated Reflection Mode Infrared Absorption Spectroscopy of Shock-Compressed Polymer Thin Films

D. S. Moore, S. D. McGrane, D. J. Funk

Applied Spectroscopy

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Research article

First published 2002-7

New Technique for Determining the Optical Constants of Liquids

C. Dale Keefe, Jason K. Pearson

Applied Spectroscopy

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Research article

First published 2003-3

Simulation on Wavelength-Dependent Complex Refractive Index of Liquids Obtained by Phase Retrieval from Reflectance Dip Due to Surface Plasmon Resonance

Jarkko J. Saarinen, Kai-Erik Peiponen, Erik M. Vartiainen

Applied Spectroscopy

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Research article

First published 2014-1

Concentration-Based Measurement Studies of L-Tryptophan Using Terahertz Time-Domain Spectroscopy (THz-TDS)

Zeynep Özer, Seher Gök, Hakan Altan [...]

Applied Spectroscopy

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Research article

First published 1999-1

Resolving Optical Constants from Reflectance of Liquids in the UV-Visible Range

Jukka A. Räty, Erik M. Vartiainen, Kai-Erik Peiponen

Applied Spectroscopy

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Research article

First published 2000-10

Confocal Raman Microscopy: Why the Depth Resolution and Spatial Accuracy Can Be Much Worse Than You Think

Neil J. Everall

Applied Spectroscopy

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