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Articles (36)

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1-10 of 36 results for Absorption depth profile

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Select article: Evaluation of Mirage Effect Spectrometry for Optical Absorption Depth Profiling of Photodegradation in Thin Poly(Vinylchloride) Films

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Research article

First published 2000-12

Evaluation of Mirage Effect Spectrometry for Optical Absorption Depth Profiling of Photodegradation in Thin Poly(Vinylchloride) Films

J. F. Power, O. V. Nepotchatykh, S.-W. Fu

Applied Spectroscopy

Select article: Dual Beam Light Profile Microscopy: A New Technique for Optical Absorption Depth Profilometry

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Research article

First published 2004-2

Dual Beam Light Profile Microscopy: A New Technique for Optical Absorption Depth Profilometry

J. F. Power, S. W. Fu

Applied Spectroscopy

Select article: Depth Profiling of the Optical Absorption Coefficient in Ultraviolet-Degraded Poly(Vinylchloride) Films by Dual Beam Light Profile Microscopy

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Research article

First published 2005-4

Depth Profiling of the Optical Absorption Coefficient in Ultraviolet-Degraded Poly(Vinylchloride) Films by Dual Beam Light Profile Microscopy

J. F. Power, S. W. Fu, O. V. Nepotchatykh

Applied Spectroscopy

Select article: Depth Profiling of Optical Absorption in Thin Films via the Mirage Effect and a New Inverse Scattering Theory. Part I: Principles and Methodology

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Research article

First published 2000-1

Depth Profiling of Optical Absorption in Thin Films via the Mirage Effect and a New Inverse Scattering Theory. Part I: Principles and Methodology

J. F. Power, S. W. Fu, M. A. Schweitzer

Applied Spectroscopy

Select article: Depth Profiling of Optical Absorption in Thin Films via the Mirage Effect and a New Inverse Scattering Theory. Part II: Experimental Reconstructions on Well-Characterized Materials

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Research article

First published 2000-1

Depth Profiling of Optical Absorption in Thin Films via the Mirage Effect and a New Inverse Scattering Theory. Part II: Experimental Reconstructions on Well-Characterized Materials

S. W. Fu, J. F. Power

Applied Spectroscopy

Select article: Equivalent Width Evaluation Methods for Doppler,Lorentz,and Voigt Profiles

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Research article

First published 2014-2

Equivalent Width Evaluation Methods for Doppler,Lorentz,and Voigt Profiles

Abdel Aziz M. Habib, Yasser S. Rammah

Applied Spectroscopy

Select article: Optical Depth Profiling by Attenuated Total Reflection Fourier Transform Infrared Spectroscopy: A New Approach

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Research article

First published 1996-9

Optical Depth Profiling by Attenuated Total Reflection Fourier Transform Infrared Spectroscopy: A New Approach

Sanong Ekgasit, Hatsuo Ishida

Applied Spectroscopy

Select article: Penetration of Light into Multiple Scattering Media: Model Calculations and Reflectance Experiments. Part I: The Axial Transfer

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Research article

First published 2012-8

Penetration of Light into Multiple Scattering Media: Model Calculations and Reflectance Experiments. Part I: The Axial Transfer

Dieter Oelkrug, Manfred Brun, Karsten Rebner [...]

Applied Spectroscopy

Select article: New Optical Depth-Profiling Technique by Use of the Multiple-Frequency Approach with Single ATR FT-IR Spectrum: Theoretical Development

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Research article

First published 1997-10

New Optical Depth-Profiling Technique by Use of the Multiple-Frequency Approach with Single ATR FT-IR Spectrum: Theoretical Development

Sanong Ekgasit, Hatsuo Ishida

Applied Spectroscopy

Select article: Nondestructive Optical Depth Profiling in Thin Films through Robust Inversion of the Laser Photopyroelectric Effect Impulse Response

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Research article

First published 1995-6

Nondestructive Optical Depth Profiling in Thin Films through Robust Inversion of the Laser Photopyroelectric Effect Impulse Response

J. F. Power, M. C. Prystay

Applied Spectroscopy

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