You are on the new improved site. You can view the old site in view-only mode here until June 27, 2026

Filter Results

Search all journals

Enter search terms…

Advanced search

/

About

About Sage
About Sage Journals
Privacy Policy
Terms of Use
Contact Us
Help

Information for

Authors
Editors
Librarians
Researchers
Reviewers
Frequently asked questions

Copyright © 2026 by Sage Publications.京ICP备09090397号-11

Search results

Search results page

Articles (2)

Journals (0)

1-2 of 2 results for 4H-SiC metal–oxide–semiconductor field-effect transistor (MOSFET)

Sort by:

Relevance

Select all

Select all

Sort by:

Relevance

Select article: Stress Characterization of 4H-SiC Metal–Oxide–Semiconductor Field-Effect Transistor (MOSFET) using Raman Spectroscopy and the Finite Element Method

Retricted access

Research article

First published 2016-7

Stress Characterization of 4H-SiC Metal–Oxide–Semiconductor Field-Effect Transistor (MOSFET) using Raman Spectroscopy and the Finite Element Method

Masanobu Yoshikawa, Kenichi Kosaka, Hirohumi Seki [...]

Applied Spectroscopy

Select article: Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy

Retricted access

Research article

First published 2011-5

Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy

Masanobu Yoshikawa, Hirohumi Seki, Keiko Inoue [...]

Applied Spectroscopy

1
10 / page

Article type

Publication date

Subjects

Access